Publikationen von Christian Niederauer

Niederauer, C.; Blumhardt, P.; Mücksch, J.; Heymann, M.; Lambacher, A.; Schwille, P.: Direct characterization of the evanescent field in objective-type total internal reflection fluorescence microscopy. Optics Express 26 (16), S. 20492 - 20506 (2018)

Niederauer, C.: Direct Characterization of the Evanescent Field in Objective-Type Total Internal Reflection Microscopy. Master, LMU, München (2018)