Publikationen von F. Keilmann

Knoll, B.; Keilmann, F.: Electromagnetic fields in the Cutoff Regime of Tapered Metallic Waveguides. Opt. Commun. 162, S. 177 - 181 (1999)

Knoll, B.; Keilmann, F.: Mid-infrared scanning near-field optical microscope resolves 30 nm. Journal of Microscopy-Oxford 194, S. 512 - 515 (1999)

Knoll, B.; Keilmann, F.: Near-field probing of vibrational absorption for chemical microscopy. Nature 399 (6732), S. 134 - 137 (1999)

Knoll, B.; Keilmann, F.: Scanning microscopy by mid-infrared near-field scattering. Applied Physics A (Materials Science Processing) 66 (5), S. 477 - 481 (1998)

Knoll, B.; Keilmann, F.; Kramer, A.; Guckenberger, R.: Contrast of microwave near-field microscopy. Applied Physics Letters 70 (20), S. 2667 - 2669 (1997)

Kramer, A.; Keilmann, F.; Knoll, B.; Guckenberger, R.: The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy. Micron 27 (6), S. 413 - 417 (1996)

Keilmann, F.; Vanderweide, D. W.; Eickelkamp, T.; Merz, R.; Stockle, D.: Extreme subwavelength resolution with a scanning radiofrequency transmission microscope. Optics Communications 129 (N1-2), S. 15 - 18 (1996)

Keilmann, F.: Towards SNIM: Scanning Near-field Microscopy in the Infrared. In: Optics at the Nanometer Scale, S. 235 - 245 (Hg. Garcia; Nieto-Vesperinas, M.; N.). IBM, Netherlands (1996)