Suchergebnisse

Schwille, P.: Cross-correlation analysis in FCS. In: Fluorescence Correlation Spectroscopy, S. 360 - 378 (Hg. Rigler, R.; Elson, E. S.). Springer, Berlin, Heidelberg (2001)

Seemüller, E.; Zwickl, P.; Baumeister, W.: Self-processing of Subunits of the Proteasome. In: Co- and Posttranslational Proteolysis of Proteins, S. 335 - 371 (Hg. Sigman; Dalbey, R.E.; D.S.). Academic Press (2001)

Thamm, P.; Kolbeck, W.; Musiol, H.-J.; Moroder, L.: Protection of the Amide group. In: Synthesis of Peptides and Peptidomimetics, S. 260 - 275. Georg Thieme Verlag, Stuttgart (2001)

Thamm, P.; Kolbeck, W.; Musiol, H.-J.; Moroder, L.: Protection of the Guanidino group. In: Synthesis of Peptides and Peptidomimetics, S. 315 - 333. Georg Thieme Verlag, Stuttgart (2001)

Barr, F.: Vesicular transport. In: MOLECULAR TRAFFICKING, S. 37 - 46. PORTLAND PRESS LTD, LONDON (2000)

Zwickl, P.; Baumeister, W.; Steven, A.: Proteasomes in Prokaryotes. In: Proteasomes: The World of Regulatory Proteolysis, S. 8 - 20 (Hg. Wolf; Hilt, W.; H.). Eurekah.com, Georgetown, TX (2000)

Frangakis, A.S.; Hegerl, R.: Nonlinear Anisotropic Diffusion in Three-dimensional Electron Microscopy. In:. In: Lecture Notes in Computer Science, Bd. 1682, S. 386 - 397 (Hg. Leeuwen, G. G.; Hartmanis, J.; van, J.). Springer Verlag, Berlin (1999)

Bieschke, J.; Schwille, P.: Aggregation of prion protein investigated by dual-color fluorescence cross-correlation spectroscopy. In: Fluorescence Microscopy and Fluorescent Probes, Bd. 2, S. 81 - 86 (Hg. Slavik, J.). Plenum Press, New York (1998)

Engelhardt, H.: Elektronenmikroskopie. In: Bioanalytik, S. 413 - 449 (Hg. Zorbas; Lottspeich, F.; H.). Spektrum Akademischer Verlag, Heidelberg (1998)

Guckenberger, R.: Basics of fourier transformation, convolution, and correlation. In: Procedures in Scanning Probe Microscopies, S. 24 - 31 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Conventional imaging modes. In: Procedures in Scanning Probe Microscopies, S. 52 - 54 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Fourier filtering. In: Procedures in Scanning Probe Microscopies, S. 37 - 39 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Image processing, evaluation and presentation - Introduction. In: Procedures in Scanning Probe Microscopies, S. 22 - 23 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Real space filtering. In: Procedures in Scanning Probe Microscopies, S. 34 - 36 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Resolution assessment. In: Procedures in Scanning Probe Microscopies, S. 44 - 49 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: STM-signals and imaging modes - Introduction. In: Procedures in Scanning Probe Microscopies, S. 50 - 51 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Test structures and calibrations - Introduction. In: Procedures in Scanning Probe Microscopies, S. 9 - 9 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Hartmann, T.; Kramer, A.; Hillebrand, A.; Guckenberger, R.: Test sample structured by metal shadowing using salt crystals as mask. In: Procedures in Scanning Probe Microscopies, S. 12 - 16 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Heim, M.; Guckenberger, R.: Pt/C coated tobacco mosaic virus on glass as a specimen for testing SPM tips. In: Procedures in Scanning Probe Microscopies, S. 17 - 21 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Knapp, H.F.; Guckenberger, R.: Overview of electro-chemical tip etching methods. In: Procedures in Scanning Probe Microscopies, S. 67 - 68 (Hg. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)