
Publications of A. J. Huber
All genres
Journal Article (11)
1.
Journal Article
17 (25), pp. 22351 - 22357 (2009)
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy. Optics Express 2.
Journal Article
30 (12), pp. 1255 - 1268 (2009)
Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains. Journal of Infrared Millimeter and Terahertz Waves 3.
Journal Article
3 (5), pp. 287 - 291 (2009)
Controlling the near-field oscillations of loaded plasmonic nanoantennas. Nature Photonics 4.
Journal Article
4 (3), pp. 153 - 157 (2009)
Infrared nanoscopy of strained semiconductors. Nature Nanotechnology 5.
Journal Article
8 (11), pp. 3766 - 3770 (2008)
Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices. Nano Letters 6.
Journal Article
92 (20), 203104, pp. 203104-1 - 203104-3 (2008)
Focusing of surface phonon polaritons. Applied Physics Letters 7.
Journal Article
229 (3), pp. 389 - 395 (2008)
Local excitation and interference of surface phonon polaritons studied by near-field infrared microscopy. Journal of Microscopy 8.
Journal Article
19 (17), pp. 2209 - 2212 (2007)
Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy. Advanced Materials 9.
Journal Article
6 (4), pp. 774 - 778 (2006)
Nanoscale resolved infrared probing of crystal structure and of plasmon-phonon coupling. Nano Letters 10.
Journal Article
89,, pp. 101 - 124 (2006)
Pseudoheterodyne detection for background-free near-field spectroscopy. Applied Physics Letters 11.
Journal Article
87 (8), 081103 (2005)
Near-field imaging of mid-infrared surface phonon polariton propagation. Applied Physics Letters Thesis - PhD (1)
12.
Thesis - PhD
Nanoscale Surface-Polariton Spectroscopy by Mid- and Far-Infrared Near-Field Microscopy. Dissertation, Technische Universität, München (2010)
Thesis - Diploma (1)
13.
Thesis - Diploma
Abbildung der strukturellen Eigenschaften von SiC mittels IR Nahfeldmikroskopie. Diploma, Technische Universität, München (2005)