Publications of F. Keilmann

Taubner, T.; Hillenbrand, R.; Keilmann, F.: Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy. Applied Physics Letters 85 (21), pp. 5064 - 5066 (2004)

Taubner, T.; Keilmann, F.; Hillenbrand, R.: Nanomechanical resonance tuning and phase effects in optical near-field interaction. Nano Letters 4 (9), pp. 1669 - 1672 (2004)

Keilmann, F.; Gohle, C.; Holzwarth, R.: Time-domain mid-infrared frequency-comb spectrometer. Optics Letters 29 (13), pp. 1542 - 1544 (2004)

Keilmann, F.; Hillenbrand, R.: Near-field microscopy by elastic light scattering from a tip. Philosophical Transactions of the Royal Society of London Series A-Mathematical Physical and Engineering Sciences 362 (1817), pp. 787 - 805 (2004)

Keilmann, F.: Scattering-type near-field optical microscopy. Journal of Electron Microscopy 53 (2), pp. 187 - 192 (2004)

Hillenbrand, R.; Keilmann, F.; Hanarp, P.; Sutherland, D. S.; Aizpurua, J.: Coherent imaging of nanoscale plasmon patterns with a carbon nanotube optical probe. Applied Physics Letters 83 (2), pp. 368 - 370 (2003)

Taubner, T.; Hillenbrand, R.; Keilmann, F.: Performance of visible and mid-infrared scattering-type near-field optical microscopes. Journal of Microscopy-Oxford 210, pp. 311 - 314 (2003)

Dekorsy, T.; Yakovlev, V. A.; Seidel, W.; Helm, M.; Keilmann, F.: Infrared-phonon-polariton resonance of the nonlinear susceptibility in GaAs. Physical Review Letters 90 (5), pp. 055508-1 - 055508-3 (2003)

Keilmann, F.: Status of THz-to-visible nanospectroscopy development. Journal of Biological Physics 29 (2-3), pp. 195 - 199 (2003)

Frey, H. G.; Keilmann, F.; Kriele, A.; Guckenberger, R.: Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe. Applied Physics Letters 81 (26), pp. 5030 - 5032 (2002)

Hillenbrand, R.; Taubner, T.; Keilmann, F.: Phonon-enhanced light-matter interaction at the nanometre scale. Nature 418 (6894), pp. 159 - 162 (2002)

Keilmann, F.: Vibrational-infrared near-field microscopy. Vibrational Spectroscopy 29 (1-2), pp. 109 - 114 (2002)

Hillenbrand, R.; Keilmann, F.: Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy. Applied Physics Letters 80 (1), pp. 25 - 27 (2002)

Hillenbrand, R.; Keilmann, F.: Optical oscillation modes of plasmon particles observed in direct space by phase-contrast near-field microscopy. Applied Physics B-Lasers & Optics 73 (3), pp. 239 - 243 (2001)

Hillenbrand, R.; Knoll, B.; Keilmann, F.: Pure optical contrast in scattering-type scanning near-field microscopy. Journal of Microscopy 202, pp. 77 - 83 (2001)

Hillenbrand, R.; Keilmann, F.: Complex optical constants on a subwavelength scale. Physical Review Letters 85 (14), pp. 3029 - 3032 (2000)

Knoll, B.; Keilmann, F.: Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Optics Communications 182 (4-6), pp. 321 - 328 (2000)

Knoll, B.; Keilmann, F.: Infrared conductivity mapping for nanoelectronics. Applied Physics Letters 77 (24), pp. 3980 - 3982 (2000)

Keilmann, F.: Surface-polariton propagation for scanning near-field optical microscopy application. Journal of Microscopy-Oxford 194, pp. 567 - 570 (1999)

Keilmann, F.; Knoll, B.; Kramer, A.: Long-wave-infrared near-field microscopy. Physica Status Solidi B-Basic Research 215 (1), pp. 849 - 854 (1999)