Publications of R. Guckenberger

Guckenberger, R.; Kösslinger, C.; Gatz, R.; Breu, H.; Levai, N.; Baumeister, W.: A scanning tunneling microscope (STM) for biological applications: design and performance. Ultramicroscopy 25 (2), pp. 111 - 121 (1988)

Guckenberger, R.; Wiegräbe, W.; Baumeister, W.: Scanning tunnelling microscopy of biomacromolecules. Journal of Microscopy. 152 (Pt 3), pp. 795 - 802 (1988)

Baumeister, W.; Barth, M.; Hegerl, R.; Guckenberger, R.; Hahn, M.; Saxton, W. O.: Three-dimensional structure of the regular surface layer (HPI layer) of Deinococcus radiodurans. Journal of Molecular Biology. 187 (2), pp. 241 - 250 (1986)

Baumeister, W.; Guckenberger, R.; Engelhardt, H.; Woodcock, C. L.: Metal shadowing and decoration in electron microscopy of biological macromolecules. Annals of the New York Academy of Sciences. 483, pp. 57 - 76 (1986)

Bachmann, L.; Becker, R.; Leupold, G.; Barth, M.; Guckenberger, R.; Baumeister, W.: Decoration and shadowing of freeze-etched catalase crystals. Ultramicroscopy 16 (3-4), pp. 305 - 320 (1985)

Engelhardt, H.; Guckenberger, R.; Hegerl, R.; Baumeister, W.: Correspondence Analysis and Surface Relief Reconstruction of 2-D periodic Bacterial Photosynthetic Membranes. Eur. J. Cell Biol. Suppl. 10, p. 21 (1985)

Engelhardt, H.; Guckenberger, R.; Hegerl, R.; Baumeister, W.: High resolution shadowing of freeze-dried bacterial photosynthetic membranes: multivariate statistical analysis and surface relief reconstruction. Ultramicroscopy 16 (3-4), pp. 395 - 410 (1985)

Guckenberger, R.: Surface Reliefs derived from Heavy-metal-shadowed Specimens. Eur. J. Cell Biol. Suppl. 10, p. 25 (1985)

Guckenberger, R.: Surface Reliefs derived from Heavy-metal-shadowed Specimens - Fourier Space Techniques applied to Periodic Objects. Ultramicroscopy 16 (3-4), pp. 357 - 370 (1985)

Colton, R.J.; Engel, A.; Frommer, J.E.; Gaub, H.E.; Gewirth, A.A.; Guckenberger, R.; Heckl, W.M.; Parkinson, B.; Rabe, J.: Procedures in scanning probe microscopy. John Wiley & Sons, Chichester, New York (1998)

Siegenthaler, H.; Guckenberger, R.; Hartmann, T.; Knapp, H.F.; Meyer, E.; Pohl, D.W.; Wiesendanger, R.: Recent Developments. Berlin, Springer (1995), 303-342 pp.

Amrein, M.; Gross, H.; Guckenberger, R.: STM of proteins and membranes. Academic press Inc., San Diego (1993), 127-176 pp.

Guckenberger, R.: Basics of fourier transformation, convolution, and correlation. In: Procedures in Scanning Probe Microscopies, pp. 24 - 31 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Conventional imaging modes. In: Procedures in Scanning Probe Microscopies, pp. 52 - 54 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Fourier filtering. In: Procedures in Scanning Probe Microscopies, pp. 37 - 39 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Image processing, evaluation and presentation - Introduction. In: Procedures in Scanning Probe Microscopies, pp. 22 - 23 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Real space filtering. In: Procedures in Scanning Probe Microscopies, pp. 34 - 36 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Resolution assessment. In: Procedures in Scanning Probe Microscopies, pp. 44 - 49 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: STM-signals and imaging modes - Introduction. In: Procedures in Scanning Probe Microscopies, pp. 50 - 51 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

Guckenberger, R.: Test structures and calibrations - Introduction. In: Procedures in Scanning Probe Microscopies, p. 9 - 9 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)